Thermal Characterization of Composite GaN Substrates for HEMT Applications

نویسندگان

  • Jungwan Cho
  • Zijian Li
  • Elah Bozorg-Grayeli
  • Takashi Kodama
  • Daniel Francis
  • David H. Altman
  • Felix Ejeckam
  • Firooz Faili
  • Mehdi Asheghi
  • Kenneth E. Goodson
چکیده

High-power operation of AlGaN/GaN highelectron-mobility transistors (HEMTs) requires efficient heat removal through the substrate. GaN composite substrates including high-thermal-conductivity substrates such as SiC and diamond are promising, but these composite substrates require careful attention to thermal resistances at GaN-substrate interfaces. We report on thermal characterization of GaN-on-SiC and GaN-ondiamond substrates using a combination of picosecond time-domain thermoreflectance (TDTR) and DC Joule heating techniques.

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تاریخ انتشار 2012